Thin Foil-based Secondary Emission Monitor for Low Intensity, Low Energy Beam Profile Measurements∗
نویسندگان
چکیده
A foil-based secondary emission monitor (SEM) was developed for beam profile measurements at the Ultra-low energy Storage Ring (USR) that will be installed at the future Facility for Low-energy Antiproton and Ion Research (FLAIR) in Darmstadt, Germany. Simulations of the optimised design of the monitor are presented. Furthermore, its usability for the low energy antiproton (p̄) beam profile monitoring is discussed.
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